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Not Available We describe the development of an affordable, tabletop Single Event Effect (SEE) Laser Probe Station that combines diode laser excitation of active areas of integrated circuits with conventional electrical probing. Laser-based SEE testing has been demonstrated as a meaningful alternative to supplement costly ion accelerator-based testing but has remained mainly as a laboratory technique not suitable for general use. Development of the proposed system would be of great value to microelectronic designers and test engineers, particularly during the development phase of radiation hardened devices. The proposed system is based on modification of an existing electro-optic probe station being commercialized by the proposing firm for non-contact wafer testing of micro-machined devices. The system architecture allows precise and reproducible positioning of the laser probe across a wafer with automated alignment and probe card positioning. During testing, the pulsed laser diode is positioned automatically to induce SEEs in sensitive areas of the device under test, and the response is monitored using standard IC testers. The Phase I effort will produce a functional prototype SEE Test system and tests performed to produce benchmark data of devices for which there is published SEE data obtained from accelerators for calibration of the testing results. The Phase I experience will result in the implementation in Phase II of a production model.