Innovative C3I Technologies (Diagnostic Technologies)

The objectives are to develop and verify Built-In Test (BIT) techniques to assure cost effective/comprehensive methodologies for performing diagnostics for electronic modules for determining optimum C4I system maintenance level. In addition to performing basic intended functions, many electronic devices also generate electromagnetic interference (EMI). The EMI is often incidental to the normal operation of the device and may result from higher order effects (e.g., nonlinearities) in the device. It has been noted that the EMI characteristics of an electronic device may exhibit large variations as a result of small changes in the normal operational characteristics of the device. Based on observations of the EMI characteristics of electronic components and circuits, there appears to be a strong correlation between the performance of the device and the resulting EMI generated by the device. Therefore, it is suggested that the EMI characteristics of a device may provide a good indication of the overall performance of a device and may provide a very sensitive means for measuring degradation of device performance. SEMTAS will investigate the application of EMI measurements to diagnose the performance of electronic components and devices. Techniques that are applicable for BIT approaches will be emphasized. The objectives of Phase I will be to develop BIT approaches for modules that are based on the application of EMI measurements and signal analysis to diagnose the performance of electronic components and devices. Emphasis will be directed toward developing approaches that will satisfy specific DOD and commercial requirements. Laboratory tests will be conducted to demonstrate the overall feasibility of the proposed technique for diagnosing degraded components. This feasibility demonstration will be conducted on a selected type of component and circuit that is widely used in both military and civilian applications.