A Portable Thermal Analysis Microscope Equipped with Multiple Excitation Sources and Magnifications for Inspecting Aircraft Components

"The application of multiple energy sources, individually or collectively, to strengthen the excitation of IR signals from specimens for nondestructive detection (NDI) with a Thermal Analysis Microscope (TAM) is proposed. Using thermal excitation with ahot plate or a laser, the TAM is capable of qualitative and quantitative detection of surface and subsurface flaws on relatively thin materials. Overlaying of the visible and IR images of the TAM enables accurate alignment of the IR images with thespecimens. Ultrasonic excitation on materials with various flaws has recently shown to generate localized frictional heating detectable with IR sensors and therefore with the TAM. The deep-penetrating ultrasonic excitation could be superior to thermalexcitation particularly for subsurface flaw detection in composite materials which can only be heated to moderate temperatures. Two or more sets of optics with different magnifications will be incorporated into the TAM. For example, optics with low orhigh magnification will be used for diagnostics or detailed inspection, depending whether processing speed or accuracy is desired. The portability of the TAM will be addressed by replacing the ion laser with a diode-pumped laser, by simplifying the IRoptics and using fiber optics when possible, and by downsizing all components. This device will provide the DoD, NASA, DoE, FAA, and other federal agencies with a cost-effective, portable, and safe