MULTISPECTRAL ELECTRO-OPTICAL/INFRARED REAL TIME SENSOR TECHNOLOGY AND RISK IDENTIFICATION STUDY

PSR WILL IDENTIFY THE VARIOUS TECHNOLOGIES WHICH COULD BE UTILIZED IN THE DESIGN OF THE MULTISPECTRAL ELECTRO-OPTICAL/INFRARED (EO/IR) REAL-TIME SENSOR, AND THE RISKS ASSOCIATED WITH THESE TECHNOLOGIES. THIS STUDY WILL IDENTIFY RELEVANT COMPONENT TECHNOLOGIES THAT COULD BE USED IN THE DEVELOPMENT OF A LINE SCANNING SENSOR WHICH OPERATES SIMULTANEOUSLY IN THE EO AND IR SPECTRAL BANDS THROUGH A SINGLE APERTURE, AND WHOSE RAW OUTPUT IS COMPATIBLE WITH A HIGH SPEED DIGITAL DATA LINK. THE COMPONENT TECHNOLOGIES THAT WILL BE EVALUATED INCLUDE OPTICAL MATERIALS & COMPONENTS, SCANNING MECHANISM(S), SPECTRAL BEAM-SPLITTER(S), DETECTORS AND PRE-PROCESSING (AMPLIFICATION, ANALOG TO DIGITAL CONVERSION, AUTOMATIC GAIN & LEVEL CONTROL, DC RESTORATION, ETC.). PSR WILL ALSO ASSESS THE RELATIVE RISKS (TECHNOLOGICAL, SCHEDULE AND COST) ASSOCIATED WITH THE IDENTIFIED COMPONENTS TECHNOLOGIES, AND THE SYSTEM RISKS ASSOCIATED WITH VARIOUS CONFIGURATIONS THAT UTILIZE THE IDENTIFIED COMPONENT TECHNOLOGIES. PSR WILL UTILIZE ITS EXTENSIVE EXPERIENCE IN EO AND IR SYSTEMS TO REVIEW AND CORRELATE CUSTOMER SYSTEM LEVEL REQUIREMENTS WITH EXISTING TECHNOLOGY DATA BASES IN ORDER TO IDENTIFY AN OPTIMUM SET SENSOR DESIGN APPROACHES.