High Rate X-Ray Flourescence Detector

X-ray fluorescence analysis is widely used in basic and applied research, and in commercial process monitoring and quality control operations. Unfortunately, for most experiments that involve fluorescence, the detector system limits the rate at which data can be collected. This project will combine digital processing electronics with a novel silicon drift detector (SDD) design to make a compact, modular, large area detector that provides significantly better resolution and throughput than currently available detector systems, with greater serviceability and lower overall costs. In Phase I, a representative SDD was obtained and measurements were made with digital processing electronics. It then was demonstrated that the electronics could fit within the detector housing, creating a very clean total package with much higher noise immunity than currently available solutions. Phase II will develop a complete multi-element detector array, including seven SDD detector modules, full processing electronics, and associated cooling and power supplies. Host software will be developed to control the new processor. Finally, an ultra-high-speed readout system will be developed, and the software needed by the system will be extended. Commercial Applications and Other Benefits as described by the awardee: Improved detectors should substantially increase the research productivity of fluorescence x-ray experiments at the DOE synchrotron facilities. The detector also should have application in the commercial x-ray market, where high throughput also equates to time and money saved. The technology would allow manufacturers to avoid the problem of combining one company¿s detector system with the processing electronics from another company.