SBIR/STTR Research Award

SCANNING TUNNELING MICROSCOPY DEVELOPMENT FOR IN SITU CORROSION RESEARCH

Award identifier 12af6ef1bdb14144aa71a7e336f5aa55430902275ab8ec1a0796c427ce2453e3Awarding agency Department of Defense · Navy

Award amount

$494,000

Program and phase

SBIR · Phase II

Award year

1988

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Award details

Awarding agency
Department of Defense
Branch
Navy
Recipient company
J. & D. Scientific, Inc.
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
Not reported
Topic code
Not reported

Research abstract

SCANNING TUNNELING MICROSCOPY HAS DEMONSTRATED THE ABILITY TO IMAGE SURFACES IN A VACUUM, AIR, AND SOLUTION AT THE ATOMIC LEVEL. THE TECHNIQUE HAS ALSO BEEN APPLIED TO POLY- CRYSTALLINE MATERIALS, THE REGIONS NEAR GRAIN BOUNDARIES, ATOMIC DEFECTS, AND THEIR RESPECTIVE LOCALIZED, SPECTROSCOP-IES. THE LOCALIZED CORROSION OF ALUMINUM ALLOYS IN SEA WATER IS A WELL-STUDIED BUT STILL NOT UNDERSTOOD PROBLEM. THE LOCALIZED CORROSION OF ALUMINUM METAL MATRIX COMPOSITES (MMC) HAS BEEN STUDIED AND HAS SHOWN THAT THESE MATERIALS ARE SUSCEPTIBLE TO PITTING THIS PROPOSED RESEARCH WILL BE AN ATTEMPT TO STUDY THE PITTING OF ALUMINUM MMC'S AT THE ATOMIC LEVEL WITH SCANNING TUNNELING MICROSCOPY. THE INITIAL PHASE II EFFORT WILL BE TO BUILD AND TEST THE STM DESIGNED IN PHASE I. THEN THE SYSTEM WILL BE USED UNDERCONTROLLED ELECTROCHEMICAL CONDITIONS TO IMAGE A VARIETY OF ELECTRODES INCLUDING ALUMINUM, IRON-BASED, AND COMPOSITE MATERIALS.

Technology keywords

Not reported

Agency intelligence

Department of Defense

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