SBIR/STTR Research Award
LOW-LOSS MICROWAVE PROBES FOR NOISE PARAMETER MEASUREMENTS
Award amount
$49,999Program and phase
SBIR · Phase IAward year
1991Award details
- Awarding agency
- Department of Defense
- Branch
- Air Force
- Recipient company
- Cascade Microtech, Inc.
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
NOISE PARAMETER MEASUREMENTS OF MICROWAVE TRANSISTORS AND MMICS ARE BEST PERFORMED WITH ON-WAFER, PROBE SYSTEMS. TWO KEY PARAMETERS OF THESE SYSTEMS IS THE LOSS FROM THE INPUT TUNER TO THE DEVICE UNDER TEST (DUT), AND FROM THE DUT TO THE RECEIVER; THIS IS TYPICALLY DOMINATED BY THE WAFER PROBE. THIS PHASE I WORK WILL DEMONSTRATE A WAFER PROBE PROTOYPE WITH SIGNIFICANTLY LOWER LOSS THAN CURRENTLY AVAILVABLE, WHILE MAINTAINING LOW RETURN LOSS AND HIGH ACCURACY.
Technology keywords
Not reported