PIN DIODE LIMITER DYNAMICS

THE DESIGN OF PIN DIODE HAVE TRADITIONALLY BEEN CONDUCTED USING LINEARCIRCUIT ANALYSIS AND INVOLVED INCORPORATING OF THE DIODE INTO A LOW PASS STRUCTURE. THIS STUDY WILL IMPLEMENT THE COMPLETE PIN DIODE MODEL INTO THE SPICE SOURCE CODE AND WILL MAKE POSSIBLE THE LINEAR AND NON LINEAR ANALYSIS IN THE TIME DOMAIN AND FREQUENCY DOMAIN. IN THE TRANSIENT ANALYSIS THE SPIKE LEAKAGE AND FLAT LEAKAGE WILL BE DISPLAYED FOR PULSE EXCITATION AND THE ENERGY ASSOCIATED IN EACH WILL BE DETERMINED BY INTEGRATION. ALSO RECOVERY TIME ANALYSIS WILL LEAD TO THEORETICAL ASSESSMENT OF THE BURN OUT LEVELS. IN ADDITION PRACTICAL EXPERIMENTS WILL BE CONDUCTED TO AUGMENT THE ELECTRICAL MODEL OF THE PIN DIODE. THEORETICAL RESULTS, FROM RECOVERY TIME ANALYSIS ON SPICE, UP TO THE BURN OUT LEVELS WILL BE COMPARED WITH PRACTICAL MEASUREMENTS. EMPHASIS WILL BE GIVEN TO NON-DESTUCTIVE TESTING AND IT'S CORRELATION WITH THE ANALYSIS. SOFTWARE WILL BE PROVIDED.