SBIR/STTR Research Award
STEPPED FREQUENCY ULTRASONIC HOLOGRAPHY FOR FLAW CHARACT.
Award amount
$455,638Program and phase
SBIR · Phase IIAward year
1984Award details
- Awarding agency
- Department of Energy
- Branch
- Not reported
- Recipient company
- Sigma Research Corp
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
ULTRASONIC IMAGING SYSTEMS OF VARIOUS TYPES ARE PRESENTLY UNDER DEVELOPMENT FOR NONDESTRUCTIVE TESTING. ALL OF THEM REQUIRE A TWO-DIMENSIONAL APERTURE TO BE SCANNED BY A TRANSDUCER, OR FILLED WITH MULTIPLE TRANSDUCERS. A PARTICULARLY INTERESTING SYSTEM IS ONE BASED ON HOLOGRAPHIC PRINCIPLES. IN MANY REACTOR LOCATIONS IT IS VERY DIFFICULT TO IMPLEMENT EITHER A SCANNER OR A LARGE ARRAY OF TRANSDUCERS. RECENT WORK HAS SHOWN THAT UNDER SOME CIRCUMSTANCES IT IS POSSIBLE TO USE FREQUENCY SWEEPING TO GENERATE A SYNTHETIC APERTURE IN ONE DIMENSION. THIS ALLOWSA SINGLE DIMENSIONAL CROSS-SECTIONAL IMAGE TO BE MADE FROM ONE FIXED TRANSDUCER, OR A TWO-DIMENSIONAL IMAGE FROM A LINE ARRAY OF TRANSDUCERS. IN THIS RESEARCH, WE WILL ADAPT THE SWEPT FREQUENCY METHOD TO OUR STANDARD HOLOGRAPHIC SYSTEM TO ACHIEVE THIS TYPE OF IMAGING.
Technology keywords
Not reported