SBIR/STTR Research Award
Precision Holder Technology for In-Situ TEM Experimentation
Award amount
$749,980Program and phase
SBIR · Phase IIAward year
2005Award details
- Awarding agency
- Department of Energy
- Branch
- Not reported
- Recipient company
- E A Fischione Instruments, Inc.
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- DOE/SC-0072
- Topic code
- 30 b
Research abstract
75272B Transmission Electron Microscopy is a technique that allows materials to be analyzed to the nanometer and sub-nanometer scales. The next level of materials analysis will require the ability to perform dynamic experimentation within the microscope, which would require specialized specimen holding technology to perform the desired experiments. This project addresses the treatment of a specimen with reactive gases at known pressures, gas flows, and temperatures (up to 2,000¿K). In Phase I, a series of technical approaches to support the desired experiments were generated and evaluated by means of solid modeling, finite element analysis. In Phase II, prototype equipment will be constructed to verify the results of the analysis. Significant experimentation will be performed in situ. The experiments will include specimen heating, mechanical stability, and gas treatment. Commercial Applications and Other Benefits as described by the awardee: The development of in situ specimen holder technology should greatly enhance the quantity and quality of information generated by Transmission Electron Microscopy. Substantial benefits would be provided to both life and physical science research by allowing structures to be characterized while undergoing various changes.
Technology keywords
Not reported
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