SBIR/STTR Research Award

STTR Phase I: High Rate Atomic Layer Deposition

Award identifier 67dbdf5c3c5a35ae4affd6f0572115353f08f88fed8b5f6b01ada9f2defb788aAwarding agency National Science Foundation

Award amount

$149,934

Program and phase

STTR · Phase I

Award year

2007

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Award details

Awarding agency
National Science Foundation
Branch
Not reported
Recipient company
SiC Systems, Inc.
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
NSF 06-553
Topic code
MI

Research abstract

This Small Business Technology Transfer (STTR) Phase I research project will develop and commercialize a new paradigm for the atomic layer deposition (ALD) manufacturing process. ALD provides unparalleled quality and thickness control, however its low deposition rates (~1 nm/min) preclude ALD from competing with conventional thermal and plasma-enhanced chemical vapor deposition (CVD/PECVD) techniques in a number of markets. Based on fundamental reactor engineering principles the standard PECVD process has been engineered to provide ALD control through pulsed power modulation. This approach dramatically simplifies ALD processing by eliminating both purge steps and the need for mechanical flow rate actuation. Since purging comprises 50-90% of a typical ALD cycle, deposition rate enhancements of up to an order of magnitude may be achieved. ALD is a rapidly expanding business fueled by its importance in the manufacture of vital electronic components such as organic light emitting diodes and thin film transistors. In addition, the use of ALD in integrated circuit manufacturing will undoubtedly expand as the industry strives to keep up with Moore's Law. The process simplifications and rate enhancements provided by the proposed approach will strengthen these areas and open new markets such as barrier coating in applications ranging from food packaging tomedical instrumentation.

Technology keywords

Not reported

Agency intelligence

National Science Foundation

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