SBIR/STTR Research Award
Precision Holder Technology for In-Situ TEM Experimentation
Award amount
$100,000Program and phase
SBIR · Phase IAward year
2004Award details
- Awarding agency
- Department of Energy
- Branch
- Not reported
- Recipient company
- E A Fischione Instruments, Inc.
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- DOE/SC-0075
- Topic code
- 30
Research abstract
75272-Transmission Electron Microscopy (TEM) is a technique that allows materials to be analyzed to the nanometer and sub-nanometer scales. This instrument could achieve a new level of materials analysis if dynamic experimentation could be performed within its microscope chamber. However, this feature would require specialized specimen-holding technology to perform the desired experiments. This project will develop technology for the treatment of a specimen with reactive gases at known pressures, gas flows, and temperatures (up to 2,000oK). Phase I will establish a series of technical approaches to address the desired experimentation. All technical approaches will be analyzed by means of solid modeling, finite element analysis, and component-level prototyping and testing. The analysis will include input from engineers, researchers, and manufacturing and marketing specialists. Phase II will integrate all components into a single device suitable for commercialization. Commercial Applications and Other Benefits as described by the awardee: The development of in situ specimen holder technology should greatly enhance the quantity of information generated by TEM. Substantial benefits would accrue to both life and physical science research by furthering the characterization of structures while undergoing various changes.
Technology keywords
Not reported