INNOVATIVE HIGH VOLUME PRODUCTION TESTING OF MMIC'S

EFFICIENT HIGH VOLUME TEST CAPABILITY FOR MONOLITHIC MICROWAVE INTEGRATE CIRCUITS (MMIC'S) IS A VITAL STEP TOWARD HIGH VOLUME DOD SYSTEMS IMPLEMENTATON AND THE REALIZATION OF THE POTENTIAL OF THIS RAPIDLY EMERGING TECHNOLOGY. A DETAILED APPROACH TO DEVELOP COST EFFECTIVE AUTOMATIC TEST PROCEDURES FOR MMIC'S IS PROPOSED TO RADC. DESCRIBED INTHE PROPOSAL ARE (A) DEVELOPMENT OF DESIGN RULES TO INSURE MMIC TESTABILITY, (B) COST EFFECTIVE LOW FREQUENCY EVALUATION CRITERIA UNIQUE TO MMIC'S, (C) DETERMINATION OF THE PROPER TESTS AND TEST LOCATIONS OF IN-PROCESS MMIC EVALUATION, AND (D) THE DESIGN OF BOTH LOW FREQUENCY AND RF AUTOMATIC TEST STATIONS TO IMPLEMENT THE PROPOSED TEST STRATEGY. KEY TO THE PROPOSED PROGRAM ARE AN INTERATED APPROACH WHICH PLACES THE BULK OF THE TESTING RESPONSIBILITY ON LOW FREQUENCY MEASUREMENTS AND THE CORRESPONDING REQUIREMENT THAT EXCELLENT CORRELATION BETWEEN LOW AND HIGH FREQUENCY (RF) MEASUREMENTS BE ESTABLISHED FOR MMIC CHIPS.