SBIR/STTR Research Award

APPLICATION OF THE SCANNING TUNNELING MICROSCOPE FOR NON-CONTACT TESTING OF HGCDTE DIODES

Award identifier 7f34a3a1df3fa7fb4b47f0da8f8a56e81da06e98da4e611c6403ebdf5f0c1fe8Awarding agency Department of Defense · Army

Award amount

$617,405

Program and phase

SBIR · Phase II

Award year

1989

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Award details

Awarding agency
Department of Defense
Branch
Army
Recipient company
FIBERTEK, INC.
Proposal award date
Not reported
Contract end date
Not reported
UEI
DX8KTH7JHYC6
Solicitation number
Not reported
Topic code
Not reported

Research abstract

A NOVEL METHOD FOR NON-CONTACT, NON-INVASIVE IN-SITU PHOTODIODE EVALUATION ON THE WAFER IS PROPOSED. THE PROPOSED METHOD IS BASED ON A MODIFIED FORM OF THE SCANNING TUNNELING MICROSCOPE (STM). ALTHOUGH PRIMARILY A TOOL FOR MATERIALS SURFACE RESEARCH, WE BELIEVE THE TECHNIQUE CAN BE ADAPTED TO MEASURE CURRENT THROUGH THE DIODE VIA TUNNELING FROM THE PROBE TIP TO THE CONTACTIVE PADS OF THE DIODES. IN CONJUNCTION WITH AN OPTICAL PROBE BEAM, THE RESPONSIVITY AT DIFFERENT WAVELENGTH AS WELL AS THE I-V CHARACTERISTIC CAN BE MEASURED.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Research funding history

173 SBIR/STTR records share this UEI (1986–2025). Reported award amounts total $69,654,466. Reported amounts are not federal obligations.

Phases: Phase I, Phase II, Phase II – Direct to Phase II

Agencies: Department of Defense, National Aeronautics and Space Administration, Department of Energy, National Science Foundation

Contractor profile

FIBERTEK, INC.

Historical federal award activity, when published, is on that contractor profile. Matched by UEI only.

Agency intelligence

Department of Defense

NAICS intelligence

This classification comes from the contractor profile, not from the SBIR award record.

Contractor industry classification NAICS 541512

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