Multiple Reflection Rayleigh Scattering Flux Monitor for MBE

Gradient Technology in conjunction with Prof. Christopher J. Palmstrom, proposes to develop a new optical monitor capable of measuring the atomic flux emitted from an effusion cell. This technique will utilize novel scattering technology under investigation here at Gradient Technology. We will be using a multiple reflection apparatus to improve the signal-to-noise ratio and optical fibers to carry the photon beam to and from the interaction region. Our design separates the optics from the laser/detector assembly, which eliminates the need for redundant equipment and decreases implementation cost. The main goal for Phase I research is different atomic fluxes, and grow a multilayer structure using only this technique to track the growth rate. During the project, several methods of producing the vacuum components will be studied to determine the most efficient and cost effective method for implementing this technique. The data gathered will be used to facilitate Phase II, the development of a product that can be used to monitor and control the flux emanating from an effusion cell.