SBIR/STTR Research Award

High Reliability Solid State Amplifier

Award identifier 06f3d6757d222b8a5c3102c6cdf0598c740669e218ce4b1434572d856bd8e13dAwarding agency Department of Defense · Air Force

Award amount

$79,073

Program and phase

SBIR · Phase I

Award year

1994

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Award details

Awarding agency
Department of Defense
Branch
Air Force
Recipient company
Comtech Corp
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
Not reported
Topic code
Not reported

Research abstract

The long term objective is to develop a high reliability, cost competitive SSA for dual use in both DOD and commercial applications. The Phase I technical objective is to develop an innovative life test methodology and the associated theoretical model for investigation of semiconductor failure under overdrive conditions. This life test methodology is generic and it has broad applications to many different semiconductor devices including HBT, FET, PHEMT, and silicon BJT. An innovative device structure, the vacuum passivated T-gate FET, will be investigated to minimize the overdrive failure.

Technology keywords

Not reported

Agency intelligence

Department of Defense

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