SBIR/STTR Research Award

Gate Oxide Screening Methodology and Surface Smoothing for Advanced SOI Space System Applications

Award identifier d7a66dd34dd90b08964d160145c2a03ad334103bca970f7eacb622c49135c756Awarding agency Department of Defense · Air Force

Award amount

$776,074

Program and phase

SBIR · Phase II

Award year

2000

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Award details

Awarding agency
Department of Defense
Branch
Air Force
Recipient company
Epion Corporation
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
Not reported
Topic code
Not reported

Research abstract

N/A

Technology keywords

Not reported

Agency intelligence

Department of Defense

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