SBIR/STTR Research Award
Rectifying Junctions for High Temperature, High Power Electronics
Award amount
$951,141Program and phase
SBIR · Phase IIAward year
1996Award details
- Awarding agency
- Department of Defense
- Branch
- Missile Defense Agency
- Recipient company
- 3c Semiconductors
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
The single most important type of metal/SiC junction is the n-type, rectifying Schottky diode, because it is the voltage blocking junction in all majority carrier devices. A reliable junction of this type for n-type SiC is the key to its development for high temperature, power conditioning electronics. Phase I will demonstrate that osmium is the ideal metal for forming such junctions. Phase II will develop SiC fast recovery diodes and MESFETs that can perform power conditioning and communications circuits applications at thigh temperatures. These devices will form the foundation for developing prototype devices and circuits to address specific applications requirements of DoD systems, and manufacturers of commercial products (e.g. cellular phones) in Phase III. Commercial markets for SiC (especially B-SiC) devices utilizing this type of junction are: high frequency power (B-SiC) solid state power devices, ultra fast recovery diodes for power conditioning, and mixer diodes for cellular phones communication.
Technology keywords
Not reported