TNF ALPHA AND AUF1 INTERACTIONS

Not Available We propose an AFM system that images orders of magnitude faster than conventional AFMs, yet maintains the same horizontal and vertical resolutions. This system will operate in both the contact and intermittent contact mode. It will optimize the AFM's operation, and it will give engineers active control over imaging dynamics. The composite system will allow researchers to probe sub-nanometer scale phenomena, over micron scale topography, at speeds never before accessible. The technical approach directly assaults the fundamental rate limiting parameters of the AFM: 1) the piezotube's resonance, and 2) the quality factor (Q) of the oscillating cantilever. By fabricating a microelectrical mechanical system (MEMS) onto the AFM's sensing element, these two problems can be simultaneously overcome. The MEMS actuator will obviate the piezotube's resonant limitation because it is small and therefore fast. The cantilever's Q limitation will be overcome by using the MEMS actuator to actively control the cantileverdynamics. If the objectives put forward in this Phase I proposal are successful, for the first time, a platform that is capable of high resolution, large z-range, high speed atomic force microscopy will be available to industry and researchers alike.