Infrared materials modeling for next generation focal plane architectures

In Phase I, AVYD DEVICES in collaboration with SRI International, will demonstrate the feasibility of our modeling approach to predict material properties and device performances using experimental parameters of growth and fabrication processes formulticolor HgCdTe detectors. The models will include point defect-dopant interactions; Fermi dopant diffusion; interdiffusion (including Fermi level effects); interactions between dopants, point defects, and extended defects; defect injection andformation during etching; and deposition of passivation layers. The models will be calibrated against experimental data. Multicolor IR sensors, weather science, metrology, industrial process monitoroing and surveillance