INSTRUMENT FOR RADIATION TESTING/SCREENING ELECTRONIC DEVICES OVER THE DOD TEMPERATURE RANGE

A PHASE II PROGRAM IS PROPOSED LEADING TO THE DEVELOPMENT OFAN INSTRUMENT THAT PROVIDES AN ACCURATE, COST-EFFECTIVE CA- PABILITY FOR MAKING RADIATION TOTAL=DOSE MEASUREMENTS OVER THE TEMPERATURE RANGE OF -55 DEG C TO 200 DEG C. THE INSTRUMENT WOULD BE UNIQUELY SUITED FOR THE RADIATION TESTING AND SCREENING OF COMPLEX ELECTRONIC DEVICES, SUCH AS VHSIC TEST CHIPS AND INTEGRATED CIRCUITS, AS WELL AS FOR TESTING STAND-ARD ELECTRONIC COMPONENTS. SEVERAL OF THE KEY ELEMENTS OF THE RADIATION TEST INSTRUMENT HAVE BEEN DEVELOPED AND TESTEDTHE FOCUS OF THE PHASE II PROGRAM WOULD BE THE DEVELOPMENT AND EVALUATION OF THE THERMAL SUBSYSTEM WHICH WOULD PERMIT RADIATION TESTS OF DOD ELECTRONIC DEVICES OVER THE -55 DEG C TO 200 DEG C RANGE. THE AREA WHERE INNOVATIVE RESEARCH ISPRIMARILY REQUIRED IS THE DEVELOPMENT OF THE CAPABILITY FOR ACHIEVING THE COLD TEMPERATURES AT THE WAFER-LEVEL WITHOU THE ATTENDANT PROBLEMS CAUSED BY THE DEVELOPMENT OF FROST ORMOISTURE BUILD UP.