Four Probe Stage and Holder for Transmission Electron Microscope

70659 A direct, in-situ, high resolution structural examination and analysis tool would benefit materials science research. However, tool development, especially nanomanipulation and in-situ characterization tools for a transmission electron microscope (TEM), is currently lacking in many respects. In particular, it is limited by having only one robotic arm. In addition, most existing tools have problems in the accurate characterization of the electrical properties of materials, due to excessive contact resistance. This project will develop a four-probe stage and holder for TEM by adopting a multiprobe approach for robotic manipulation and characterization. It will offer the flexibility of four point probe electrical measurements on materials either suspended in space or dispersed on surface. Phase I will construct the new TEM holder, incorporating a four probe manipulation and characterization platform with electrical feedthrough. Stick/slip linear actuators, built within mini-sized piezotubes, will be assembled and tested. The performance of the proposed four probe stage and holder will be demonstrated inside a TEM. Commercial Applications and Other Benefits as described by the awardee: The device should become a powerful tool for researchers to accelerate their investigations into the properties of nanomaterials and their applications. The consequent expansion of research on nanomaterials and progress towards applicable nanotechnology also should stimulate economic activity and usher in new industries focused upon providing nanotechnology products.