THE DESIGN AND DEVELOPMENT OF AN ELECTRON BEAM DEFLECTION DIAGNOSTIC TOOL

THIS RESEARCH PROGRAM WILL ANALYZE AND DEMONSTRATE A NEW ELECTRON BEAM DIAGNOSTIC TOOL BASED ON THE DEFLECTION OF TEST ELECTRONS BY THE ACCELERATED BEAM. A TIGHTLY FOCUSED STREAM OF TEST ELECTRONS IS INJECTED ACROSS THE PATH OF THE BEAM TO BE DIAGNOSED. THE TEST ELECTRONS ARE DEFLECTED IN A MEASURABLE WAY BY THE ELECTROMAGNETIC FIELDS OF THE BEAM UNDER TEST, AND THE DIRECTION AND MAGNITUDE OF THE DEFLECTION ARE DIRECTLY RELATED TO THE SPATIAL AND TEMPORAL CHARGE DISTRIBUTION OF THE BEAM. THIS DIAGNOSTIC TOOL HAS THE ADVANTAGES THAT IT DOES NOT PERTURB THE ELECTRON BEAM AND THAT IT OFFERS THE POSSIBILITY OF RESOLVING BEAM PARAMETERS ON THE TIME SCALE OF THE MICROBUNCH IN AN RF ACCELERATOR. FURTHERMORE, A VARIETY OF DETECTORS CAN BE USED TO MONITOR THE DEFLECTED BEAM, DEPENDING ON THE TIME RESPONSE AND SPATIAL RESOLUTION REQUIRED. TRAJECTORY CALCULATIONS HAVE BEEN PERFORMED FOR THE TEST PARTICLES, INDICATING THAT RELATIVELY LOW ENERGY TEST ELECTRONS (10-50 KEV) CAN BE USED TO DIAGNOSE THE BEAM. THESE ELECTRONS ARE DEFLECTED BY LARGE AMOUNTS (>1 CM) BY ELECTRONMICROBUNCHES WITH TOTAL CHARGE ON THE ORDER OF A NANOCOULOMB AND PULSE DURATION ON THE ORDER OF 10 PSEC. THE CALCULATIONS INDICATE, FOR EXAMPLE, THAT THE TRANSVERSE MICROBUNCH POSITION CAN BE RESOLVED TO LESS THAN 100 MICRONSWITH A SIMPLE IMPLEMENTATION OF THIS TOOL. THE GOAL OF THE PHASE I PROGRAM IS TO EXTEND THE ANALYSIS TO DETERMINE THE RESOLUTION WITH WHICH THE DIAGNOSTIC TOOL CAN MEASURE THE BEAM MICROSTRUCTURE, TO IDENTIFY CRITICAL COMPONENTS AND DESIGN A FULL-SCALE DIAGNOSTIC SYSTEM THAT COULD BE BUILT AND TESTED DURING A PHASE II PROGRAM, AND TO COMPARE THE CAPABILITIES AND LIMITATIONS OF A BEAM DEFLECTION DIAGNOSTICTOOL WITH OTHER AVAILABLE DIAGNOSTIC SYSTEMS.