DOUBLE PULSED CCD PHASE SAMPLED LASER SPECKLE INTERFEROMETRIC METROLOGY FOR NDT/E

FEASIBILITY RESEARCH AND DEVELOPMENT OF A NON-DESTRUCTIVE TESTING AND EVALUATION METHOD, DOUBLE PULSED CCD PHASE SAMPLED LASER SPECKLE METROLOGY (DPLSI) IS PROPOSED. THIS TECHNOLOGY HAS THE POTENTIAL OF MAKING IT POSSIBLE, IN AN INDUSTRIAL CONTEXT, TO ANALYZE THE TEMPORAL AND STATIC DEFORMATION OF BOTH MATERIALS AND ASSEMBLIES, WITH NO CONTACT, TO A RESOLUTION IN SPATIAL DISPLACEMENT OF 0.25 M AND RESONANCE MODES AT FREQUENCIES APPROACHING 50,000 HZ. THE PROPOSED TECHNOLOGY WILL BE CAPABLE OF RESOLVING BOTH THE ABSOLUTE AND GRADIENT IN-PLANE AND OUT-OF-PLANE SURFACE DISPLACEMENT AS WELL AS THE DYNAMIC (TIME-DEPENDENT)AND RESONANCE BEHAVIORS OF OBJECTS UNDER TEST. REALIZATION OF THE FULL POTENTIAL OF THIS TECHNIQUE REQUIRESTHE INTEGRATED DEVELOPMENT OF A NEW APPROACH OF GENERATING THE INTERFEROGRAMS AS WELL AS THE CREATION OF NEW AND INNOVATIVE REALTIME PROCESSING ALGORITHMS. A SOFTWARE AND HARDWARE FEASIBILITY STUDY OF THESE IS PROPOSED. THIS RESEARCH WILL BE DIRECTED TOWARDS THE PHASE II PRODUCTION AND PHASE III COMMERCIALIZATION OF SUCH A DEVICE. A DEVELOPED TECHNOLOGY OF THIS KIND IS APPLICABLE TO A HOST OF EXTANT NDT AND NDE APPLICATIONS, IN BOTH THE COMMERCIAL AND MILITARY SECTORS.