SBIR/STTR Research Award

SURFACE DEFECT MEASUREMENTS OF COMPUTER HARD DISKS

Award identifier 4c8c863f5730fb7a11912bcde9971bf46d4bafde05904bb23d203e70d999e2a9Awarding agency National Science Foundation

Award amount

$203,000

Program and phase

SBIR · Phase II

Award year

1988

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Award details

Awarding agency
National Science Foundation
Branch
Not reported
Recipient company
Photographic Sciences Corp.
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
Not reported
Topic code
Not reported

Research abstract

THIS PROPOSAL PRESENTS A RESEARCH PLAN FOR THE MEASUREMENT OF SURFACE DEFECTS ON EITHER HARD DISK MEDIA OR HARD DISK SUBSTRATES. THESE DEFECTS CAN EFFECT THE PERFORMANCE OF A COMPUTER DISK AS THE HEAD TRACKS OVER THE SURFACE. THE PROPOSED RESEARCH PROGRAM IS TO MEASURE SURFACE DEFECTS ON COMPUTER HARD DISKS USING NON-CONTACT OPTICAL SCANNING INTERFEROMETRY. THE EFFECTS OF SIGNAL TO NOISE RATIO, SIGNAL BANDWIDTH, LASER SPOT SIZE, AND FOCUSING ERRORS WILL BE STUDIED FOR SEVERAL DISK ROTATION SPEEDS. THE ANTICIPATED RESULT OF THE PHASE I RESEARCH WILL BE THE CHARACTERIZATION OF A COMPUTER HARD DISK SURFACE AROUND ONE CIRCULAR SEGMENT. THE IMPLICATION OF THIS RESEARCH IS THE POTENTIAL FOR A RAPID NON-CONTACTING MEASUREMENT TECHNIQUE OF SURFACE FEATURES OF A FINISHED HARD DISK OR UNCOATED HARDDISK SUBSTRATE. THE POTENTIAL APPLICATION OF THIS RESEARCH IS THE DEVELOPMENT OF NEW MEASUREMENT TECHNIQUES AND TEST EQUIPMENT FOR THE COMPUTER INDUSTRY. THESE NEW MEASUREMENT TECHNIQUES AND TEST EQUIPMENT WILL HAVE THE POTENTIAL TO IMPROVE THE QUALITY OF COMPUTER HARD DISKS.

Technology keywords

Not reported

Agency intelligence

National Science Foundation

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