Functional Circuit Board Test Program Development System

The proposed approach considers test program development as a consequence of building a functional model of the UUT using a black box approach. This is accomplished through a revolutionary new approach to test and measurement equipment that brings the testinstrument directly to the UUT pin and circuit path, virtually eliminating signal path loss and problems associated with the lack of test points incorporated within a printed circuit board. The proposed functional test program set development system isanticipated to produce high fault coverage diagnostic test programs in a fraction of the time it takes using traditional techniques, at a lower per unit cost.