SBIR/STTR Research Award

NEW METHOD FOR MEASURING TRACE ELEMENTS IN II-VI SEMICONDUCTING MATERIALS

Award identifier efad0551bb215c4d8ed8552c0494305d07da0e76e2ab6218ddc09bc95ee53605Awarding agency Department of Defense · Army

Award amount

$500,000

Program and phase

SBIR · Phase II

Award year

1990

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Award details

Awarding agency
Department of Defense
Branch
Army
Recipient company
Vhg Laboratorys Inc.
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
Not reported
Topic code
Not reported

Research abstract

MEASUREMENT OF CRITICAL TRACE LEVEL ELEMENTS IN SEMICONDUCTING MATERIALS MAY BE POSSIBLE USING A SPECIAL ATOMIC ABSORPTION SPECTROPHOTOMETRY TECHNIQUE. DIRECT VAPORIZATION OF SOLID SAMPLES COMBINED WITH A HIGHLY EFFICIENT SYSTEM TO CORRECT FOR NON-ANALYTE ABSORPTION WILL BE INVESTIGATED ON CDTE MATERIALS.

Technology keywords

Not reported

Agency intelligence

Department of Defense

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