SBIR/STTR Research Award

Gate Oxide Screening Methodology and Surface Smoothing for Advanced SOI Space System Applications

Award identifier fd5b462b1e950cdda7d6901dd8350e3a4f2fd342e75c530e1f952920ed5d6979Awarding agency Department of Defense · Air Force

Award amount

$99,978

Program and phase

SBIR · Phase I

Award year

1999

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Award details

Awarding agency
Department of Defense
Branch
Air Force
Recipient company
Epion Corporation
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
Not reported
Topic code
Not reported

Research abstract

N/A

Technology keywords

Not reported

Agency intelligence

Department of Defense

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