SBIR/STTR Research Award

SBIR Phase I: Repair and Manufacturing of Integrated Circuit Probe Cards through Innovations in Electrochemical Printing

Award identifier a8988c600e8ca3c8e8a6e6d7c85529a12c22dbc3cee7fc5e16ffbfd90a540c73Awarding agency National Science Foundation

Award amount

$99,906

Program and phase

SBIR · Phase I

Award year

2008

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Award details

Awarding agency
National Science Foundation
Branch
Not reported
Recipient company
Ionographics, Incorporated
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
NSF 07-586
Topic code
EO

Research abstract

This Small Business Innovation Research Phase I Project is to develop Electrochemical Printing technology for the repair of integrated circuit (IC) test probe cards. Electrochemical Printing (EcP) will be developed as a tool for repairing and manufacturing small quantities of high value metal micro-structures on probe cards. EcP is a maskless solid freeform fabrication technique that electrodeposits dense metal micro-scale patterns beneath a rastering microjet print nozzle. The broader impact of this research is to provide an economical means of repair for probe cards that are currently scrapped.

Technology keywords

Not reported

Agency intelligence

National Science Foundation

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