Frozen Storage of Human Platelets with Directly Transfusable Cryoprotectants

Not Available Mission Research Corporation (MRC) proposes to develop and demonstrate a solution to the single event effects (SEE) problems which result in data loss in deep submicron microcircuits used in space environments. We describe a unique hardening technique, which we refer to as a temporally redundant latch. This approach provides immunity to SEE related upset effects with a minimal impact on microcircuit design methods and circuit performance. The objective of our proposal is to demonstrate the viability of the temporally redundant latch technique in a microcircuit that is important to the military and commercial space industry. The selected microcircuit will be fully hardened for space applications. It will serve as a proof o principal for the hardening technique and lead to other temporal latch insertions in microcircuits developed for space missions. The temporally redundant latch will permit microcircuits with deep submicron feature sizes to be used in space environments. The design technique eliminates single event upsets (SEU) and prevents single event transients (SET0 generated in combinational logic from disrupting microcircuit operation.