SBIR/STTR Research Award

Electronics for Large Superconducting Tunnel Junction Detector Arrays for Synchrotron Soft X-ray Research

Award identifier 19608a1f73d247481c356d4fea2d8ef46ed32994239af6c9b6abcda0ff961d33Awarding agency Department of Energy

Award amount

$100,000

Program and phase

SBIR · Phase I

Award year

2009

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Award details

Awarding agency
Department of Energy
Branch
Not reported
Recipient company
XIA LLC
Proposal award date
Not reported
Contract end date
Not reported
UEI
J26GQK3R6773
Solicitation number
DE-FOA-0000350
Topic code
06 c

Research abstract

The Department of Energy provides four national synchrotron radiation facilities to support advanced research in all fields by supplying intense brilliant x-ray beams covering a wide range of energies. However, x-ray detector development has not kept pace with developments in x-ray sources and beam line facilities. For example, current detectors do not have adequate energy resolution for use in the soft x-ray regime (0.2 ¿ 2.0 KeV). This is an issue because much important science could be done if adequate detectors were available. In the past 5-10 years, superconducting tunnel junction (STJ) detectors have been developed that are capable of delivering 10-20 eV energy resolution at high count rates in this soft x-ray regime. However, because these detectors are tiny (200 µm x 200 µm), they need to be used in arrays of 100s or 1,000s to be effective. This project will develop low cost, easy to use electronics to support such large arrays cost effectively, so that a 1,000-element STJ detector array could be purchased for the same price as the large HPGe now being used in the hard x-ray regime, while delivering 100s of times more counts with at least 5-times-better energy resolution. In Phase I, the concept will be tested with an ultra-compact, low noise preamplifier and coupled to an existing digital processor. Commercial Applications and other Benefits as described by the awardee If successful, these detectors would allow the nation's synchrotron facilities to significantly enhance the scientific return on investment in x-ray sources by opening up the soft x-ray regime to highly productive fluorescence analysis techniques. In addition, by providing detectors optimized for very-low-voltage scanning electron microscopy, these detectors would benefit the semiconductor industry by providing a superior way to study manufacturing defects.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Awards with the same topic code

Verified by an exact topic code match. This is not a text-similarity match.

Research funding history

61 SBIR/STTR records share this UEI (1990–2025). Reported award amounts total $18,466,389. Reported amounts are not federal obligations.

Phases: Phase I, Phase II

Agencies: Department of Energy, Department of Health and Human Services, Department of Commerce

Agency intelligence

Department of Energy

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