SBIR/STTR Research Award
Functional and Diagnostic Analysis of Circuits using Laser or Electron Beam Scanning Technology
Award amount
$99,580Program and phase
SBIR · Phase IAward year
2001Award details
- Awarding agency
- Department of Defense
- Branch
- Air Force
- Recipient company
- IMAGE GRAPHICS, INC.
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
IGI PROPOSES AN INVESTIGATION INTO USING THE GENERATION AND CONTROL OF SECONDARY ELECTRONS FROM ELEMENTS ON A PRINTED CIRCUIT BOARD AS A DIAGNOSTIC TOOL FOR TESTING AND DETERMINING FAILURES IN PRINTED CIRCUIT BOARD COMPONENTS. THIS PROPOSED WORK CONSISTSOF INVESTIGATING VARIOUS TEST METHODOLOGIES USING A MODIFIED IGI ELECTRON BEAM IMAGE RECORDER AS A TEST BED. IN ADDITION, METHODS BY WHICH THE NECESSARY INTELLIGENCE REQUIRED TO PROPERLY ADDRESS THE ELECTRON BEAM ONTO THE PCB CAN BE OBTAINED, AS WELL ASMETHODS OF GENERATING ACCURATE INTERPRETIVE SOFTWARE FOR THE DIAGNOSIS OF FAILURES ON THE BOARDS,WILL BE INVESTIGATED.BY ADAPTING IGI'S ELECTRON BEAM RECORDER TECHNOLOGY, PRINTED CIRCUIT BOARDS AS LARGE AS 18
Technology keywords
Not reported