Palstic Encapsulated Microcircuit Storage Accelerated Agw Model

Information on the effect of long term dormant storage is essential for making correct parts selection and design decisions for next generation strategic programs of particular concern is the effect of exposure to elevated temperature and humidity, which may produce more corrosion in stored devices than in operating devices where power dissipation reduces moisture condensation. An accelerated age model for long term storage would reduce the time needed to gather data for risk assessment on the use of PEMS in weapon systems. This timely assessment of the reliability risks in a weapons systems containing PEMs would provide operating and support cost reductions over the life cycle of a weapons systems. ERS Inc proposes to develop an accelerated age model for storage risk assessment of PE's that accounts for the various environmental conditions, and subsequently in a Phase II to conduct a design of experiments accelerated testing program for calibration and validation of the model. The model will be developed for use on a carputer with provisions for the input of all materials, structural, and reliability parameters. This model will be tailorable to specific environments through the use of a validated environments database. In doing this, ERS Inc will leverage its expertise in the area of storage and dormant electronics modeling and its CADMP-IIe reliability assessment software tool. The Government and industry will find the model and software useful for many applications. (1) the design manual can be used as a guide for ensuring reliable storage and operation; (2) the software can be used to specify minimum design requirements; (3) the software can be used to flag potentially harmful dormancy effects on electronic devices; and (4) the software provices a tool to determine failure modes and mechanisms