SBIR/STTR Research Award
A FOUR-POINT-PROBE METER FOR NON-DESTRUCTIVE MEASUREMENTS OF RESIST-IVITIES OF III-V COMPOUND SEMICONDUCTORS
Award amount
$150,000Program and phase
SBIR · Phase IIAward year
1985Award details
- Awarding agency
- Department of Defense
- Branch
- Air Force
- Recipient company
- Four Dimensions, Inc.
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
A METHOD TO USE THE FOUR-POINT-PROBE TECHNIQUE TO MEASURE RESISTIVITIES OF THE III-V AND II-VI COMPOUND SEMICONDUCTORS WITHOUT ALLOYING THE CONTACT SPOTS IS PROPOSED. IT WILL ENABLE US TO MAKE THOSE MEASUREMENTS WITH BETTER GEOGRAPHICAL RESOLUTION, MORE ACCURATELY AND IN WIDER RANGE THAN THE EXISTING METHODS. THE BACKGROUND OF THE TECHNIQUE AN ITS PRINCIPLE ARE DESCRIBED. THE BLOCK DIAGRAM OF THE DESIGN AND ITS EXPLANATION ARE PROVIDED. THE PLAN TO EXECUTE THE PROJECT IS DISCUSSED.
Technology keywords
Not reported