Next generation ultra-wide dynamic range x-ray Mixed-Mode Pixel Array Detector

One key deficiency of modern synchrotron x-ray detectors is the inability to capture images at fast frame rates while maintaining single x-ray sensitivity, high instantaneous count rate, and wide dynamic range. This limitation constrains performance of research experiments, leaving scientists unable to answer fundamental questions. This Phase IIb program aims to introduce a next-generation Mixed-Mode Pixel Array Detector with a wide dynamic range, capable of up to 10 kHz imaging, bridging the gap between synchrotron light source capability and experiments. The objective of the project is to develop a 16 x 16 pixel small size imaging application-specific integrated circuit with improved capabilities that can be utilized to construct a 128 × 128 pixel full scale version. Phase II involves the fabrication, development of readout electronics, testing, and an examination of a new integrated circuit pixel elements that will be employed in the design of the smaller array. This method incorporates future-focused planning and guarantees a methodical flow from design to assessment. A test pixel device was designed and fabricated in Phase II. The test pixel contains iterations of new design elements for increased performance and radiation hardness that were identified in Phase I. Test pixel element evaluation will be conducted as well as a final review of Phase II results. Evaluation includes measuring radiation hardness using long term x-ray exposure, and linearity of new current and voltage digital to analog converters. Successful completion will lead to the development and testing of a small array system in Phase IIb. The goal of Phase IIb is to create a 16 x 16 pixel detector, utilizing the knowledge gained from Phase II to maximize performance and reduce the risks involved in developing an large scale application-specific integrated circuit. This plan includes schematic design, simulation and layout. In tandem, a readout electronics system architecture will be defined including specification of power and signaling, and establishment of firmware and software controls to test the integrated circuit in a synchrotron environment. This plan also includes collecting user feedback, examining the market, and assesses emerging technologies to create a product road map that guarantees a methodical flow from design to deployment. The development of a commercial second-generation detector will provide researchers a reliable instrument that can fulfill emerging requirements. The second generation Mixed-Mode Pixel Array Detector will enable many presently unfeasible experiments, accelerating the pace of structural material studies. An important part of this work is engaging users as beta testers of these detectors to aid in optimizing their use at synchrotron facilities.