In-space X-ray Analyzer

To meet the NASArsquo;s needs for in-space inspection, Advanced Analyzer Labs, Inc. (AAL) proposes an innovative X-ray analyzer.nbsp; This analyzer is designed to be portable, compact, low power, safe, light weight, flexible, and highly efficient for conducting the following None-destructive Evaluation (NDE) tests using X-ray Diffraction (XRD), X-ray Fluorescence (XRF), and X-ray imaging.Inspection of additively manufactured parts in space.Detection of commonly known defects in materials.Analysis of regolith/drill core samplesThe key innovation of this X-ray analyzer is the utilization of a large, intensive collimating X-ray beam, with a diameter of up to 15mm, to facilitate flexible XRD, XRF, and X-ray imaging measurements. nbsp;The parallel beam geometry of the analyzer enhances the reliability and efficiency of XRD and XRF measurements and improves the flexibility and efficiency of X-ray imaging.The significant innovation of this analyzer is:Highly efficient and reliable from using one compact X-ray source and parallel beam geometry.Simple and flexible configuration to implement multiple NDE X-ray functions.Safe due to the collimating beam is easy to constrain.Portable and flexible for in-situ and in-field tests of AM parts, and other components/samples.nbsp;The compact size, lightweight, low power consumption, safety, flexibility, and multiple capabilities of the X-ray analyzer make it a highly desirable tool for NASA#39;s in-space inspection needs.