SBIR/STTR Research Award

High-resolution/high-precision PEM Quality Control

Award identifier dcd172bad790c7749925799b9399413aaa73c7757f0ea73c860221b3055be3d5Awarding agency Department of Energy

Award amount

$199,900

Program and phase

SBIR · Phase I

Award year

2023

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Award details

Awarding agency
Department of Energy
Branch
Not reported
Recipient company
RESONON, INC.
Proposal award date
2023-07-10
Contract end date
2024-05-09
UEI
Z1S4HKGLTL65
Solicitation number
DE-FOA-0002903
Topic code
C56-18h

Research abstract

High-quality, defect free, and consistent thickness Proton Exchange Membrane (PEM) films are required to ensure maximum efficiency and longevity over the life of hydrogen fuel cells or electrolyzers utilizing this technology. The current technologies of PEM film Quality Assurance (QA) and defect detection rely on human inspection, which can be subjective and labor intensive, or measurement technologies with insufficient resolution or insufficient sampling to monitor the entire PEM film quality in a high-speed production environment. This inefficiency in QA directly contributes to either a higher cost for and/or a lower quality of PEM films sufficient for use in the hydrogen fuel cell industry. An innovative technology using thin film interference detected by an imaging spectrometer will be developed into a commercial system that can be installed in-line to a PEM film manufacturing process. This system will be able to monitor film thickness at thousands of points across the web of the film at a rate consistent with a roll-to-roll production process. The output will provide a “map” of the film that can inform real-time QA processes during or after manufacture of the film. The objective of the Phase I effort will be to produce a commercialized version of the software and a design for a complete prototype film thickness sensing system for high-speed production environments. The Phase I effort is designed around high-quality commercial production of PEM films for hydrogen fuel cells and electrolyzers. However, the technology is readily applicable to many thin film manufacturing processes, e.g., thin film deposition on silicon semiconductors during integrated circuit manufacturing.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Awards with the same topic code

Verified by an exact topic code match. This is not a text-similarity match.

Research funding history

22 SBIR/STTR records share this UEI (2003–2023). Reported award amounts total $9,471,682. Reported amounts are not federal obligations.

Phases: Phase I, Phase II

Agencies: Department of Energy, National Aeronautics and Space Administration, National Science Foundation, Department of Health and Human Services, Department of Defense, Department of Agriculture

Agency intelligence

Department of Energy

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