SBIR/STTR Research Award

Single Event Burnout Hardened High-power Diamond Devices

Award identifier 3f7282ba62564612fd241ac75046ad709df665acff9123206e3778cedfd2c3e2Awarding agency National Aeronautics and Space Administration

Award amount

$899,986

Program and phase

SBIR · Phase II

Award year

2023

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Award details

Awarding agency
National Aeronautics and Space Administration
Branch
Not reported
Recipient company
EUCLID BEAMLABS LLC
Proposal award date
2023-06-09
Contract end date
2025-06-08
UEI
UUP7AMSJBLL2
Solicitation number
SBIR_22_P2
Topic code
Z1

Research abstract

Electrical power management designed for use in spacenbsp;requiresnbsp;electronics capable of operating without damage in the galactic cosmic ray space radiation environment. Unfortunately, the adoption ofnbsp; SiC and GaN technology into space applications is hindered by their susceptibility to permanent degradation and catastrophic failure from single-event effect heavy-ion exposure. This degradation occurs at lt;50% of the rated operating voltage, requiring the operation of SiC/GaN devices at de-rated voltages.nbsp;nbsp;Diamond is one of the candidate materials for the next-generation WBG semiconductor devices capable of overcoming the current limitations of SiC/GaN technology. In addition to having the highest breakdown field, it has the highest p-type conductivity, making it a unique p-channel material for power electronics. It also holds a solid hope to be hardened against single-event burnout (SEB) due to its superior thermal conductivity and ability to maintain excellent crystallinitynbsp;under heavy ion exposure.nbsp;Euclid Beamlabs, in collaboration with Rensselaer Polytechnic Institute, will develop a new quasi-lateral diamond power MOSFET (QLDT)nbsp; that will overcome current limitations by combining the inherent advantages of diamond material, SEB hardened transistor design with advanced 3D femtosecond laser writing capabilities of micrometer-scale conductive structure fabrication inside the diamond. The project#39;s primary focus is developing a SEB-tolerantnbsp;diamond transistor design with a 2D Hole Gasnbsp;conductive channel and graphitized embedded connections. The targeted specifications are a 1,200+ V voltage rating with 1.0 mOhm-cm2nbsp;specific on-resistance.nbsp;nbsp;In Phase II, we will focus on the 3D simulations of QLDTsnbsp;at supercomputer facilities.nbsp;Thennbsp;we evaluate the SEB performance of QLDTs under varying conditions.nbsp;We will also fabricate a QLDT prototype following the fabrication process flow outlined in Phase 1. The prototype will be tested at the heavy-ion terrestrial facility.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Research funding history

38 SBIR/STTR records share this UEI (2015–2025). Reported award amounts total $17,194,412. Reported amounts are not federal obligations.

Phases: Phase I, Phase II, Phase II – Direct to Phase II

Agencies: Department of Energy, Department of Defense, Department of Health and Human Services, Department of Homeland Security, National Aeronautics and Space Administration

Agency intelligence

National Aeronautics and Space Administration

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