FACT: Fast and Accurate Detection of Counterfeit Microelectronics

Counterfeit microelectronics are a growing concern in the global electronics market. Most counterfeit inspection techniques are based on electrical testing, which is labor-intensive, time consuming, and requires a subject matter expert to develop the test and analyze the results. Another method is physical inspection and the use of advanced imaging instruments, e.g., X-ray, IR imaging microscopes, however they are not commercially available as a low-cost solution. Such challenges make these techniques impractical to use by a field agent who is on a remote-site, away from major facilities, and with limited expertise. The proposed work, Fast and Accurate Detection of Counterfeit Microelectronics (FACT) by Caspia Technologies will develop a system that utilizes a handheld device capable of rapidly and non-invasively detecting counterfeit microelectronics using optical imagery to be used by Customs and Border Protection (CBP) agents located at U.S. Ports of Entry (POEs). The handheld device, (such as a cell phone or camera), is connected to a software package on the cloud that is running artificial intelligence and machine learning framework for automated counterfeit analysis. This real-time system architecture is quick and easy-to-use for operators with no imaging nor testing expertise. For Phase I, Caspia Technologies will develop and demonstrate a design concept for FACT using state-of-the-art image processing and machine learning methods that will be adapted for microelectronic anomaly detection. We will also produce a final report evaluating the feasibility of the framework. The proposed activities will progress commercialization goals of offering a cost-effective, accurate, non-invasive, real-time counterfeit detection system.