Compensated 4D ultrafast pulse characterization

Ultrafast lasers are used or proposed for use in many areas of accelerator applications; for example, drivers for novel accelerator concepts for future colliders and in the generation, manipulation, and x-ray seeding of electron beams. While end-to-end modeling of ultrafast laser systems is important for the development of new sources, model verification is also needed for the development of higher power and more efficient ultrafast laser systems and amplifiers. Standard ultrafast laser pulse measurement systems, no matter how compact, are relatively large devices that require a beam input. In order to measure the pulse at an arbitrary location within an ultrafast system, the pulse must be sampled at the desired measurement location. In this SBIR, we will develop new methods to measure ultrafast laser pulses throughout an optical system, which will help to verify models for ultrafast optical systems including amplifiers. In Phase I, we will demonstrate the feasibility of our proposed techniques for the measurement of ultrafast laser pulses anywhere within an optical system. Models of optical systems will be verified as well as the accuracy and precision of our measurement technique. Our ultrafast laser pulse measurement technology will provide badly needed diagnostics in commercial markets. Our ultrafast pulse measurement technology will be used for scientific research, manufacturing, and the semiconductor industry.