Terahertz cyber security testing using artificial intelligence

The goal this work is to use AI to interpret the THz and sub-THz responses at the pins to the defects and deviations from design of the integrated circuits under test. The key application is work is identifying hardware security treats using artificial intelligence (AI) for cyber security applications. Our approach will provide a rapid, inexpensive, and non-destructive technology address this problem. We will use a new terahertz AI testing routine for non-destructive identification of integrated circuits, in-situ and even under bias, via interpreting their response to terahertz and/or sub-terahertz radiation at the circuit pins for the response classification and interpretation. Our test technique uses the intensity, polarization, frequency, and bias dependences of the THz response at the VLSI or MMIC pins. It could be also applied for prediction lifespan and reliability of integrated circuits and electronic devices.