Crystallographic orientation mapping of minimally prepeared large nonplanar surfaces

The importance of determining crystallographic orientation information over large areas has existed within the materials science community for solutions to a variety of applications in aerospace and otherwise since the connection of MTRs and material performance was discovered, but it isn’t until recently that a feasible solution has existed. In this work, MRL will demonstrate the feasibility of determining crystallographic orientation over large minimally prepared nonplanar surfaces using SRAS and PLM methods. Should the work prove to be feasible, industrial, academic, and DoD users will be able to rapidly characterize materials in a way that far exceeds the speed of EBSD while simultaneously reducing the cost to obtain such data. This will be especially valuable to allowing additively manufactured parts to meet the criteria required to be considered flight ready.