Microscope Residual-Gas Luminescent Beam Profile Monitors

Advanced beam diagnostics are essential for reliable operation of high-performance accelerators and the intense beams produced by them. Non-invasive diagnostics can be used continuously with intense beams, while invasive techniques interfere with the beams and distort the beam profiles. In addition, traditional solid-based beam monitoring instrumentation produces unacceptable levels of radiation operating in high power beam environments. Noninvasive determination of accelerated particle distributions and profiles is the most difficult task of bunch diagnostics. Muons, Inc. proposes to develop non-interfering residual-gas beam profile monitors for transfer lines with pulse-to-pulse precision of better than 0.1 mm in position and size that will operate over a wide range of proton beam intensities including those needed for multi- MW beams of future facilities. Our innovative approach is to develop a low mass residual-gas profile monitor, where beam induced fluorescence will be used to monitor the beam profile. An original scheme of light collection using a mirascope, an optical device invented in the 16th century, is proposed. The gas composition and pressure in the beam pipe are locally controlled to minimize unwanted radiation and to improve resolution. In Phase I we will simulate the operation of the profile monitor. The mirascope light collection system will be designed. Light intensifier will be ordered and adapted for a profile monitor. The fabrication and testing of an industrial strength version of the profile monitor will be done in Phase II. COMMERCIAL APPLICATIONS AND OTHER BENEFITS: This advanced universal low cost residual-gas profile monitor can replace all other profile monitors used in high power accelerators used for discovery science as well as those used for future industrial applications such as Accelerator-driven Subcritical Reactors, Muon Beam Tomography and for homeland security applications.