Wide dynamic range x-ray Mixed-Mode Pixel Array Detector

Synchrotron light sources and X-ray free electron lasers are now generating shorter pulses with more intense light than ever before possible. The capabilities of these new sources grant unprecedented access into the workings of the natural world. X-ray detectors, as they currently stand, cannot accommodate the large dynamic range of collected x-rays in modern scattering experiments. This capability gap in the detector market leaves scientists unable to answer fundamental questions. Statement of how this problem is being addressed The proposed program will advance the development of a novel wide dynamic range x-ray mixed-mode pixel array detector conceived within a national laboratory. This mixed-mode detector has demonstrated single x-ray sensitivity with a dynamic range of greater than 108 photons per second per pixel with a read noise of 0.16 photons. The technology has evolved to the proof of concept phase and the proposed program will leverage the current developments at the national laboratory to transition the technology from prototype into a commercial instrument. What was done in Phase I During Phase I the technology of the proof of concept detector was transferred to the small business, who then evaluated and conceptually redesigned the system to a commercial robust platform with a larger active area and a state of the art fiber optic interface, by leveraging existing technology from their portfolio. What is planned for the Phase II project In the Phase II project, two parallel objectives will be executed 1) the remaining design components will be developed and the detector will be fabricated, tested and installed at several light source beamlines for full system evaluation and 2) an updated application specific integrated circuit will be developed to rapidly push the detector technology forward, so as to be ready for the needs of the future upgraded light sources. Commercial Applications and Other Benefits A robust and commercially supported detector with the current proven performance specifications will enable x-ray scattering without the need to introduce structured semitransparent beam stops or phase diffusers, which is not possible with today’s commercial detectors. This will lead to new higher resolution, and sharper contrast diffraction patterns and higher resolution structure determination. These advances will provide the user community with unparalleled resolution of data sets with even larger dynamic ranges, drastically improve scientist’s ability to collect data, and allow greater insight into materials.