Novel Ultra-High Rate Finishing Processes for Production of 100 mm Epi-ready GaN Substrates Title on abstract leaves out the word "Novel")
Award amount
$149,998Program and phase
SBIR · Phase IAward year
2015Award details
- Awarding agency
- Department of Energy
- Branch
- Not reported
- Recipient company
- Sinmat Inc
- Proposal award date
- 2015-06-08
- Contract end date
- 2016-03-07
- UEI
- EKDLPTKX33M6
- Solicitation number
- DE-FOA-0001227
- Topic code
- 11a
Research abstract
Technology keywords
Not reported
Other awards by this recipient
Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.
- Novel Reactive Defect Reduction Polishing Technology for Scalable Production of ElectronicDiamond Wafers
- Efficient Manufacturing of Low Defect Density SiC Substrates using a Novel Defect Capped Planarization Assisted Growth (DC-PAG) Method
- Innovative Polishing Technology for Fabrication of High Performance Epi-ready GaSb Substrates
- Production of Reduced Defect Density (112) Silicon Wafers Utilizing Ultra- Gentle, Chemical Mechanical Smoothening (CMS) Process
- SBIR Phase I: Low Cost Scalable Manufacturing of Patterned Sapphire Substrates (PSS) for High Efficiency LEDs
Awards with the same topic code
Verified by an exact topic code match. This is not a text-similarity match.
- Hybrid Interferometric and Deflectometric Stitching and Data Reconstruction for X-ray Mirrors
- Optical Metrology for High Performancec X-Ray Mirrors
- 11.a. X-ray Beamline Control with an Online Model for Automated Tuning and Reconfiguration
- Fusion of Incompatible Thermoplastics by Adapting Vitrimer Concept
- Novel Compatibilizer for Plastic Waste Reduction
Research funding history
42 SBIR/STTR records share this UEI (2002–2016). Reported award amounts total $12,792,050. Reported amounts are not federal obligations.
Phases: Phase I, Phase II
Agencies: Department of Defense, National Science Foundation, Department of Energy