Hard X-ray Area Detector Using Direct Converter Layer

Synchrotron radiation is a powerful tool for measuring structural properties of materials. Important applications of higher energy synchrotron X-rays include measurement of strain and material evolution during processing, studies of composite materials and studies of layered systems such as environmental-barrier coatings, metal- nitride coatings and solid oxide fuel cells. Detector requirements for these applications include large area, high sensitivity, wide dynamic range, high spatial resolution and fast response. None of the existing detectors meet all of these requirements. We propose to develop a direct detection imager consisting of a compound semiconductor layer coupled to an amorphous silicon thin film transistor array. This detector promises to have higher sensitivity and higher spatial resolution than indirect detectors currently in use. In addition, a low-cost method that can easily be scaled to large areas will be employed to couple the semiconductor layer to the read out array. Commercial Applications and Other Benefits: In addition to the synchrotron applications mentioned above, a high resolution, large area detector would have important applications in X-ray diffraction and medical imaging including breast tomosynthesis and portal imaging.