Transient Electromagnetic Simulator for EMP Survivability Analysis of Packaged Electronic Systems

ABSTRACT: High-power electromagnetic (HPEM) interference can disrupt normal operation of aircraft electronic systems and cause mission abort or even endanger the crew. HPEM energy couples into these systems mostly through the conductors in the power distribution network (PDN) of packaged chipsets. This process needs to be better understood. Modeling and simulation (M & S) of the HPEM interaction with the PDN is needed to identify problem areas through sensitivity studies, and to evaluate possible solutions. Multi-conductor transmission line (MTL) simulations can model this process. Simulation inputs include the circuit geometry, so the tool interface must be computer-aided design (CAD)-based to represent the system geometry in three dimensions. The TechFlow Scientific team has an extensive background in HPEM effects on electronics, from hardware testing to M & S. We have experience with each step of the solution, including the circuit layout, CAD interfaces, transient MTL simulation, and HPEM coupling to electronics. We also have experience using, integrating, and augmenting the specific tools we plan to use in the solution. We understand HPEM interference and are at the forefront of research into how it causes effects. We will leverage this solid background to develop a CAD-based transient MTL simulation tool for modeling HPEM interactions with the PDN. BENEFIT: The completion of this software will be of great benefit to the whole of the HPEM directed energy (DE) community, in that it will help us better understand the HPEM interactions with IC chipsets that lead to HPEMI on electronic systems, currently the least-understood part of the problem. The Joint Radio-frequency Effectiveness Model (JREM) software is a mature tool that has been through a formal Verification and Validation (V & V) process. It models RF propagation very well, and uses either the DREAM tool or empirical data to represent the effect on target systems. The overall JREM tool will benefit greatly from the availability of a transient MTL simulator and automated connection to SPICE modeling to calculate the interactions with more fidelity, leading to a better understanding of HPEMI, weapon lethality, and system vulnerability. Military agencies will be interested to use the comprehensive HPEMI analysis tool to do system designs of packaged electronics with reduced HPEMI susceptibilities, provide analysis of possible effects. The tool will also be of interest to the commercial space industry to provide HPEMI susceptibility analysis for their systems. The widespread current need for this kind of software tool, and the even greater future need, make the probability of success in this venture very high.