Instrumentation for Nanoscale Spectroscopy

ABSTRACT: This STTR proposal is the natural consequence of our collaboration that makes use of the established know-how under the MURI program, the established track record of RHK in commercialization of critical hardware, software and electronic controllers to implement scanning probe microscopy with nanometer scale resolution of structural, electrical and optical materials properties for more than 25 years to develop a commercial measurement platform for tip- enhanced optical spectroscopy. Once completed, the instrument will enable routine near-field tip-enhanced optical imaging with spatial resolutions in the range of 10-50nm[1] along with topographic and transport (scanning tunneling microscopy) determinations. Furthermore, it will allow vibrational spectroscopy (Raman scattering, infrared absorption) to be performed with the same nanometer scale resolution. BENEFIT: This project will benefit the Air Force by enabling simultaneous characterization of multiple materials and device properties on the nanoscale, thereby providing a solution to an unanswered materials characterization challenge of paramount importance to our national security by improving unique improvements in our capability to screen for and reverse engineer high energy density materials, radar absorbing materials, biologically active nano-systems, and nuclear nanomaterials.