Instrumentation for Nanoscale Spectroscopy

We propose to develop a combination Tip-Enhanced Raman Scattering and Shear-Force Microscopy (TERS-SFM) instrument to study the composition and morphology of nanoparticles, surfaces, and biofilms on any substrate material. The instrument developed during Phase I will rely upon Scanning Tunneling Microscopy combined with TERS (TERS-STM) to test the effects of various excitation wavelengths and tip morphologies. It will provide Raman imaging with a resolution of less than 30 nm and a pixel integration time of less than 100 ms. The results of these experiments will guide the concurrent development of a TERS-SFM system that can accept non-conductive substrates. The instrument will incorporate a High-NA optical design for efficient epi-illumination of the samples. The ultimate goal of this STTR program is the construction of a nano-resolved Raman system that overcomes the problem of current TERS-STM microscopes by making use of high-NA illumination while not being restricted to thin, transparent, or conductive samples. BENEFIT: A Raman scattering spectrometer with sub 30 nanometer resolution and compatibility with a wide variety of substrate materials would be of tremendous benefit to industry and science. The non-destructive method would have potential applications ranging from chemical identification to VLSI quality control, to characterizing nanowaveguides for the photonics industry. An important use for this instrument, with significant commercial potential, is the mapping of drug delivery within cells. Nanomaterials are occupying a greater place in our world, and a diagnostic platform that rapidly resolves their compositional structure would accelerate the state of the nano-science immeasurably.