SBIR/STTR Research Award
In-situ Stress and Temperature Optical Monitoring for low-cost heteroepitaxial substrates for HgCdTe infrared detectors.
Award amount
$69,571Program and phase
SBIR · Phase IAward year
2010Award details
- Awarding agency
- Department of Defense
- Branch
- Army
- Recipient company
- k-Space Associates, Inc.
- Proposal award date
- 2010-06-16
- Contract end date
- 2010-12-16
- UEI
- MFJSKTKNHJX4
- Solicitation number
- 2009.3
- Topic code
- A09-151
Research abstract
The feasibility of an in-situ, real-time, non-contact system for optically monitoring temperature in the range 25-800C on Si, GaAs, and CdTe-buffered Si/GaAs substrates will be demonstrated. Real-time measurement of thin-film stress and surface reflectivity during deposition on these substrates, including samples provided by NVESD, will also be developed. Temperature measurement will be performed via band-edge thermometry and blackbody radiation analysis, while stress and reflectivity measurement will be made using an etalon-based multiple laser array approach. Data acquisition will be home-pulse triggered, with provisions made for the non-integer shaft-to-stage rotation ratio of V80H MBE reactors.
Technology keywords
Not reported
Other awards by this recipient
Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.
- Advanced, High-Sensitivity, Multi-Species, In-Situ Film Growth Monitor Utilizing Atomic Absorption Spectroscopy
- Advanced, High-Sensitivity, Multi-Species, In-Situ Film Growth Monitor Utilizing Atomic Absorption Spectroscopy
- In-situ Stress and Temperature Optical Monitoring for low-cost heteroepitaxial substrates for HgCdTe infrared detectors.
Research funding history
4 SBIR/STTR records share this UEI (2010–2016). Reported award amounts total $1,905,827. Reported amounts are not federal obligations.
Phases: Phase II, Phase I
Agencies: Department of Defense, Department of Energy